SN74ABT541B-EP规格参数_功能图_原厂出售

• 控制基线
  • 一个装配/测试场地，一个制造场地
• 增强的减少制造源(DMS）支持
• 增强的产品变更通知
• 资格的血统
• 最先进的史诗,2B™ BiCMOS Design Significantly Reduces Power Dissipation
• 锁存性能超过500 m一个 / JEDEC标准jed -17
• 典型的V_OLP (Output Ground Bounce） < 1 V at V_CC= 5v, t_一个 = 25°C
• 上电和下电时的高阻抗状态
• High-Drive Outputs (–32-m一个 I_哦, 64-m一个 I_OL）

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly 一个ccelerated Stress Test (H一个ST） or biased 85/85, temperature cycle, autoclave or unbiased H一个ST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
史诗,2B是德州仪器的商标。